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Posts Tagged ‘defect density’

Optimal function length: an analysis of the cited data

September 10, 2023 No comments

Careful analysis is required to extract reliable conclusions from data. Sloppy analysis can lead to incorrect conclusions being drawn.

The U-shaped plots cited as evidence for an ‘optimal’ number of LOC in a function/method that minimises the number of reported faults in a function, were shown to be caused by a mathematical artifact. What patterns of behavior are present in the data cited as evidence for an optimal number of LOC?

The 2000 paper Module Size Distribution and Defect Density by Malaiya and Denton summarises the data-oriented papers cited as sources on the issue of optimal length of a function/method, in LOC.

Note that the named unit of measurement in these papers is a module. In one paper, a module is specified as being as Ada package, but these papers specify that a module is a single function, method or anything else.

In order of publication year, the papers are:

The 1984 paper Software errors and complexity: an empirical investigation by Basili, and Perricone analyses measurements from a 90K Fortran program. The relevant Faults/LOC data is contained in two tables (VII and IX). Modules are sorted in to one of five bins, based on LOC, and average number of errors per thousand line of code calculated (over all modules, and just those containing at least one error); see table below:

     Module         Errors/1k lines   Errors/1k lines
     max LOC          all modules      error modules     
        50              16.0               65.0
       100              12.6               33.3
       150              12.4               24.6
       200               7.6               13.4
      >200               6.4                9.7

One of the paper’s conclusions: “One surprising result was that module size did not account for error proneness. In fact, it was quite the contrary–the larger the module, the less error prone it was.”

The 1985 paper Identifying error-prone software—an empirical study by Shen, Yu, Thebaut, and Paulsen analyses defect data from three products (written in Pascal, PL/S, and Assembly; there were three versions of the PL/S product) were analysed using Halstead/McCabe, plus defect density, in an attempt to identify error-prone software.

The paper includes a plot (figure 4) of defect density against LOC for one of the PL/S product releases, for 108 modules out of 253 (presumably 145 modules had no reported faults). The plot below shows defects against LOC, the original did not include axis values, and the red line is the fitted regression model Defects approx LOC^{0.5} (data extracted using WebPlotDigitizer; code+data):

Defects against LOC, plus fitted regression line, using data extracted from Shen et al.

The power-law exponent is less than one, which suggests that defects per line is decreasing as module size increases, i.e., there is no optimal minimum, larger is always better. However, the analysis is incomplete because it does not include modules with zero reported defects.

The authors say: “… that there is a higher mean error rate in smaller sized modules, is consistent with that discovered by Basili and Perricone.”

The 1990 paper Error Density and Size in Ada Software by Carol Withrow analyses error data from a 114 KLOC military communication system written in Ada; of the 362 Ada packages, 137 had at least one error. The unit of measurement is an Ada package, which like a C++ class, can contain multiple definitions of types, variables, and functions.

The paper plots errors per thousand line of code against LOC, for packages containing at least one error, i.e., 62% of packages are not included in the analysis. The 137 packages are sorted into 8-bins, based on the number of lines they contain. The 52 packages in the 159-251 LOC bin have an average of 1.8 errors per 1 KLOC, which is the lowest bin average. The author concludes: “Our study of a large Ada project shows this optimal size to be about 225 lines.”

The plot below shows errors against LOC, red line is the fitted regression model Errors approx LOC^{0.7} for 125 < LOC (data extracted using WebPlotDigitizer from figure 2; code+data):

Defects against LOC, plus fitted regression line, using data extracted from Withrow.

The 1993 paper An Empirical Investigation of Software Fault Distribution by Moller, and Paulish analysed four versions of a 750K product for controlling computer system utilization, written in assembler; the items measured were: DLOC (‘delta’ lines of code, DLOC, defined as “… the number of added or modified source lines of code for a version as compared to the prior version.”) and fault rate (faults per DLOC).

This paper is the first to point out that the code from multiple modules may need to be modified to fix a defect/fault/error. The following table shows the percentage of faults whose correction required changes to a given number of modules, for three releases of the product.

                   Modules
   Version  1    2    3     4     5     6
      a    78%  14%  3.4%  1.3%  0.2%  0.1%
      b    77%  18%  3.3%  1.1%  0.3%  0.4%
      c    85%  12%  2.0%  0.7%  0.0%  0.0%

Modules are binned by DLOC and various plots appear in the paper; it’s all rather convoluted. The paper summary says: “With modified code, the fault rates steadily decrease as the module size increases.”

What conclusions does the Malaiya and Denton paper draw from these papers?

They present “… a model giving influence of module size on defect density based on data that has been reported. It provides an interpretation for both declining defect density for smaller modules and gradually rising defect density for larger modules. … If small modules can be
combined into optimal sized modules without reducing cohesion significantly, than the inherent defect density may be significantly reduced.”

The conclusion I draw from these papers is that a sloppy analysis in one paper obtained a result that sounded interesting enough to get published. All the other papers find defect/error/fault rate decreasing with module size (whatever a module might be).

Low defect density implies climate code less, not more, reliable

December 24, 2012 2 comments

I have just been reading a paper comparing the defect density of three climate modeling systems against software from other application domains. The defect density (total reported defects divided by thousands of lines of code) of the climate modeling software was significantly lower than everything else, leading the researchers to conclude that “… suggests that the models are of high software quality,”. I would draw the opposite conclusion, the models have low reliability (I have no idea what software quality is and avoid using the term).

I don’t disagree with Pipitone and Easterbrook numbers, just their conclusion.

There is a very simple technique for creating software that has a low defect density, don’t try too hard to look for defects. There are two reasons why I think this has happened with the climate model software:

  1. Three of the non-climate systems compared against were the Apache HTTP demon, the VTK visulalization toolkit and the Eclipse project. These are all wide used projects with many thousands of users, millions for Apache; this volume of usage corresponds to a huge amount of testing and it is no wonder that so many faults have been reported. Each climate model tends to be used by one site, a tiny amount of testing and it is not surprising that few faults have been reported.
  2. Climate models have a big intrinsic testing problem; what is the result of a test supposed to be? With applications such as word processors, browsers, compilers, operating systems, etc the expected behavior is known in many cases so it is possible to write a test cases that checks for the expected behavior. How does anybody know what the expected behavior of a climate model is? If all the climate models did was to solve the Navier-Stokes equation on a rotating sphere there would be no need for multiple models and the UK Meteorological Office’s Unified model would not have grown from 100 KLOC to 800+ KLOC over the last 15 years.

The one system having a similar defect density to the climate models that Pipitone and Easterbrook compare against is an air traffic control system developed using formal methods, exactly the kind of (expensive and time consuming) development process that one would expect to have a low defect density.

Software is remarkably fault tolerant and so, yes serious fault could exist in the climate models and they would still give answers that looked about right. Based on his experience working on a meteorological model Les Hatton tells the story of a fault so serious that the answers should be completely wrong, but they were not.

If somebody wants to convince me that the software in any of these climate models really is reliable then I want to know about the test suites used to check the behavior; what coverage of the source does the suite have (a high MC/DC would be very good but I would settle for a very high statement coverage) and how were the expected behaviors calculated.